Adsorption of Organic Phosphate onto Silicon

DOI

This proposal presents to directly measure ¿bridging¿ of anionic surfactants on an anionic surface through multivalent ions from water under well-controlled conditions (pHs and ionic strength). In particular, we seek the adsorption behaviour of Bis-(2-ethylhexyl) phosphates (e.g. Na-DEHP and Ca2+-DEHP2), the phosphorus analogue to AOT (sodium di-2-ethylhexylsulfosuccinate), on silicon/silicon oxide wafers. Neutron reflection is the most direct approach to identify such an adsorbed layer.

Identifier
DOI https://doi.org/10.5286/ISIS.E.24089971
Metadata Access https://icatisis.esc.rl.ac.uk/oaipmh/request?verb=GetRecord&metadataPrefix=oai_datacite&identifier=oai:icatisis.esc.rl.ac.uk:inv/24089971
Provenance
Creator Professor Stuart Clarke; Dr SEUNG YEON LEE; Mr Xiaofan Wang; Dr Rebecca Welbourn; Dr Chris Truscott; Miss Lucy Griffin
Publisher ISIS Neutron and Muon Source
Publication Year 2015
Rights CC-BY Attribution 4.0 International; https://creativecommons.org/licenses/by/4.0/
OpenAccess true
Contact isisdata(at)stfc.ac.uk
Representation
Resource Type Dataset
Discipline Photon- and Neutron Geosciences
Temporal Coverage Begin 2012-12-16T09:47:49Z
Temporal Coverage End 2012-12-18T09:14:00Z