Nitrogen impurity study in oxide semiconductors under photo excitation

• 396
• ARGUS
• Nitrogen
• Shimomura
• Watanabe
• excitation
• impurity
• oxide
• photo
• semiconductors
• study
• under

Identifier
DOI	https://doi.org/10.5286/ISIS.E.24090239
Metadata Access	https://icatisis.esc.rl.ac.uk/oaipmh/request?verb=GetRecord&metadataPrefix=oai_datacite&identifier=oai:icatisis.esc.rl.ac.uk:inv/24090239

Provenance
Creator	Professor Koichiro Shimomura; Dr Isao Watanabe; Professor Antonio Fernandez-Barbero; Dr Manuel Serrano Ruiz; Professor Antonio Romerosa Nievas; Dr Benjamin Sierra Martin; Dr Omar Chmaissem; Dr Sevda Avci; Dr Ray Osborn; Dr Margarita Russina; Dr Daniel Roach; Mr Michael Garba; Dr Hiroko Ariga; Professor Eiko Torikai; Dr Amir Haghighirad; Mr John Muse; Dr Katsu Ishida; Dr Harry Tom; Dr Koji Yokoyama; Dr Ichiro Shiraki; Mr Amba Datt Pant; Professor Kanetada Nagamine; Dr Masaharu Sato; Dr Shinji Okada; Dr Yu OISHI; Dr Yue Ma
Publisher	ISIS Neutron and Muon Source
Publication Year	2017
Rights	CC-BY Attribution 4.0 International; https://creativecommons.org/licenses/by/4.0/
OpenAccess	true
Contact	isisdata(at)stfc.ac.uk

Representation
Resource Type	Dataset
Discipline	Photon- and Neutron Geosciences
Temporal Coverage Begin	2013-03-17T00:00:00Z
Temporal Coverage End	2014-02-24T00:00:00Z