The image integrates: -the final processed results from simultaneous topographical and mechanical AFM analysis performed on a 20 µm² area of the polymer surface. The image displays the corrected topography obtained through a first-order flattening filter applied in NanoScope Analysis 1.9 software, alongside mechanical properties such as adhesion, dissipation, and Young’s modulus; -cross-sectional profiles of Young’s modulus and dissipation, extracted from the AFM measurements described above; - a schematic illustration of the AFM measurement setup.