Diffusion kinetics and structural properties of chemically strengthened titania-doped soda-lime silicate glasses were studied by depth-resolved X-ray photoelectron spectroscopy, Raman spectroscopy and spectrophotometry. Chemical strengthening (CS) is frequently used to strengthen thin glasses. CS of glass is based on ion exchange of larger ions from a molten salt into glass. Both the ion and counter ion are conventionally monovalent alkali ions. Diffusion kinetics and structural properties of chemically strengthened titania-doped (TiO2) soda-lime silicate (SLS) glasses were studied by depth-resolved X-ray photoelectron spectroscopy, Raman spectroscopy and spectrophotometry. The glasses were ion exchanged, whereby Na+ in the glass was replaced by K+ in a molten salt bath, at four different treatment temperatures between 350 and 500 °C. The following samples were prepared and analyzed by X-ray Photoelectron Spectroscopy (XPS): (1) SLS, (2) 4.7% TiO2, and (3) 9.9% TiO2. The ion exchange procedure was performed for 5 h at four different temperatures below Tg (350, 400, 450 and 500 °C). Before XPS measurements, the samples were wet-etched using hydrofluoric (HF) acid to produce samples with six different etching depths. The Raman scattered light was detected in the backscattering configuration employing linear polarization and 2400 lines/mm grating, and a 100x objective lens. Depth profile spectra were collected at six different depths of 0, 10, 20, 30, 40, and 50 µm for each glass sample, employing 12 scans with a 10 s exposure time for each scan. Spectrophotometric measurements were conducted before and after K+/Na+ ion-exchange treatmeatment for 5 h at 500 °C, collected between 300 and 2500 nm. File List: XPS: XPS_4.7%TiO2_350degrees_acq1.txt XPS_4.7%TiO2_350degrees_acq2.txt XPS_4.7%TiO2_400degrees_acq1.txt XPS_4.7%TiO2_400degrees_acq2.txt XPS_4.7%TiO2_450degrees_acq1.txt XPS_4.7%TiO2_450degrees_acq2.txt XPS_4.7%TiO2_500degrees_acq1.txt XPS_4.7%TiO2_500degrees_acq2.txt XPS_4.7%TiO2_500degrees_acq3.txt XPS_4.7%TiO2_500degrees_acq4.txt XPS_9.9%TiO2_350degrees_acq1.txt XPS_9.9%TiO2_350degrees_acq2.txt XPS_9.9%TiO2_400degrees_acq1.txt XPS_9.9%TiO2_450degrees_acq1.txt XPS_9.9%TiO2_450degrees_acq2.txt XPS_9.9%TiO2_450degrees_acq3.txt XPS_9.9%TiO2_500degrees_acq1.txt XPS_9.9%TiO2_500degrees_acq2.txt XPS_9.9%TiO2_500degrees_acq3.txt Variable 1: KE_Ti 2p 8, Description: Kinetic Energy, Unit: eV Variable 2: BE_Ti 2p 8, Description: Binding Energy, Unit: eV Variable 3: CPS_Ti 2p 8, Description: Ti XPS specta, Unit: Counts per s Variable 4: Ti 2p_1_Ti_2p 8, Description: Ti4+ 2p3/2 deconvolution, Unit: Counts per s Variable 5: Ti 2p_2_Ti 2p 8, Description: Ti4+ 2p1/2 deconvolution, Unit: Counts per s Variable 6: Ti 2p_3_Ti 2p 8, Description: Ti3+ 2p1/2 deconvolution, Unit: Counts per s Variable 7: Ti 2p_4_Ti 2p 8, Description: Ti3+ 2p3/2 deconvolution, Unit: Counts per s Variable 8: Background_Ti 2p 8, Description: Background spectra, Unit: Counts per s Variable 9: Envelope_Ti 2p 8, Description: Sum of the deconvolutions and background, Unit: Counts per s Variable 10: Normalised_Residual_Ti 2p 8, Description: Normalised residual spectra, Unit: Counts per s Variable 11: Residual_Ti 2p 8, Description: Residual spectra, Unit: Counts per s Raman spectroscopy: Raman_SLS_untreated_depth1.txt Raman_SLS_500deg_depth6.txt Raman_SLS_500deg_depth5.txt Raman_SLS_500deg_depth4.txt Raman_SLS_500deg_depth3.txt Raman_SLS_500deg_depth2.txt Raman_SLS_500deg_depth1.txt Raman_SLS_450deg_depth1.txt Raman_SLS_400deg_depth1.txt Raman_SLS_350deg_depth1.txt Raman_4.7%TiO2_untreated_depth1.txt Raman_4.7%TiO2_500deg_depth6.txt Raman_4.7%TiO2_500deg_depth5.txt Raman_4.7%TiO2_500deg_depth4.txt Raman_4.7%TiO2_500deg_depth3.txt Raman_4.7%TiO2_500deg_depth2.txt Raman_4.7%TiO2_500deg_depth1.txt Raman_4.7%TiO2_450deg_depth1.txt Raman_4.7%TiO2_400deg_depth1.txt Raman_4.7%TiO2_350deg_depth1.txt Raman_9.9%TiO2_untreated_depth1.txt Raman_9.9%TiO2_500deg depth6.txt Raman_9.9%TiO2_500deg _depth5.txt Raman_9.9%TiO2_500deg _depth4.txt Raman_9.9%TiO2_500deg _depth3.txt Raman_9.9%TiO2_500deg _depth2.txt Raman_9.9%TiO2_500deg _depth1.txt Raman_9.9%TiO2_450deg _depth1.txt Raman_9.9%TiO2_400deg _depth1.txt Raman_9.9%TiO2_350deg _depth1.txt Variable 1: #Wave, Description: Wavelength, Unit: cm-1 Variable 2: #Intensity, Description: Raman intensity, Unit: Counts per s Spectrophotometry: SLS_AbsorptionCoefficient_untreated.txt SLS AbsorptionCoefficient_treated.txt 4.7%TiO2_AbsorptionCoefficient_untreated.txt 4.7%TiO2_AAbsorptionCoefficient_treated.txt 9.9%TiO2_AbsorptionCoefficient_untreated.txt 9.9%TiO2_AbsorptionCoefficient_treated.txt Variable 1: Description: Wavelength, Unit: nm Variable 2: Description: Absorption coefficient, Unit: cm-1

Diffussionskinetik och strukturella egenskaper för kemiskt härdade titanoxid dopade soda kalk silikat glas studerades med djupupplöst fotoelektronspektroskopi, Ramanspektroskopi och spektrofotometri. Vänligen se den engelska katalogsidan för utförligare beskrivning. Se engelska katalogsidan för fillista och varibelförklaringar och se readme-filen för mer utförlig beskrivning.