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Interaction of muonium centres and excess carriers in highly injected silicon
We have developed a method to measure carrier recombination lifetime in crystalline silicon with the photo-muSR technique. The key of the method is to measure the dependence of... -
Photoinduced carrier lifetime in silicon: E-field application for carrier sep...
This continuing experiment is proposed based on our previous experiment RB1510208, which we have carried out just recently. The experiment successfully observed the lifetime of...
