-
Replication Data for: A statistical characterization of dielectric breakdown ...
This dataset contains the results of Ramped Voltage Stresses (Ig-Vg curves) applied to induce the BD of the gate stack of FDSOI nanowire transistors, together with the... -
Replication Data for: A statistical characterization of dielectric breakdown ...
This dataset contains the results of Ramped Voltage Stresses (Ig-Vg curves) applied to induce the BD of the gate stack of FDSOI nanowire transistors, together with the...
