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Replication Data for: A statistical characterization of dielectric breakdown ...
This dataset contains the results of Ramped Voltage Stresses (Ig-Vg curves) applied to induce the BD of the gate stack of FDSOI nanowire transistors, together with the... -
Replication Data for: Physical Unclonable Functions based on the post-breakd...
This dataset contains the Id-Vd, Ig-Vg and Id-Vg characteristics measured on FDSOI nanowire transistors after the Dielectric Breakdown (BD) of the gate stack. The measurements... -
Replication Data for: A statistical characterization of dielectric breakdown ...
This dataset contains the results of Ramped Voltage Stresses (Ig-Vg curves) applied to induce the BD of the gate stack of FDSOI nanowire transistors, together with the...
