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X-Ray Fluorescence Data from analysis of inks of wood blocks and prints from ...
XRF (Elio: 40kV, 80 µA, spot measurements of 60s each) analysis of inks from wood blocks and prints from the Rylands Library, Manchester... -
X-Ray Fluorescence and Reflectography Data from Paris, Bibliothèque Nationale...
XRF (Elio: 40kV, 20 µA, spot measurements of 60s each), and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from BNF Parisinus Coislin... -
X-Ray Fluorescence and Reflectography Data from Dublin, Chester Beatty Librar...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, x200 magnification for spots on... -
X-Ray Fluorescence and Reflectography Data from Berlin, Staatsbibliothek zu B...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, vis, NIR and UV light) analysis... -
XRF INK ANALYSIS OF SOME HERCULANEUM PAPYRI
Recent research has suggested that some of the inks used in Herculaneum papyri do not consist of pure carbon. Starting from this finding, in June 2018 a preliminary campaign of... -
X-Ray Fluorescence and Reflectography Data from Paris, Bibliothèque Nationale...
XRF (Elio: 40kV, 20 µA, spot measurements of 60s each), and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from BNF Ms LAT10757(10th... -
X-Ray Fluorescence Data from Zürich, Zürich Central Library Ms Rh. 131
XRF (Elio: 40kV, 20 µA, spot measurements of 60s each) analysis of inks from Zurich Central Library Ms Rh. 131 (9th century CE) from Zürich Central Library... -
X-Ray Fluorescence and Reflectography Data from Dublin, Chester Beatty Libra...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, vis, NIR and UV light) analysis... -
X-Ray Fluorescence and Relectography Data from Paris, Bibliothèque Nationale ...
XRF (Elio: 40kV, 20 µA, spot measurements of 60s each), and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from BNF Lat9654 from the... -
X-Ray Fluorescence and Reflectography Data from Munich, Staatsarchiv München ...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from Staatsarchiv... -
X-Ray Fluorescence Data from Dublin (Ireland), Chester Beatty Library, Ms Cod...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) analysis of inks from Ms Pma5 / Medinet Madi Codex B (late 4th -5th century CE) from Dublin Chester Beatty... -
X-Ray Fluorescence and Reflectography Data from Cambridge, Wren Library Ms B1...
XRF (Elio: 40kV, 100 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, x200 magnification for spots on... -
X-Ray Fluorescence Data from Naples, Biblioteca Nazionale di Napoli, selectio...
XRF (Elio from the University of Cologne: 40kV, 100 µA, single spots of 120s each) analysis of ink on 38 fragments of Herculaneum papyri from the collection of the... -
X-Ray Fluorescence and Reflectography Data from Paris, Bibliothèque Nationale...
XRF (Elio: 40kV, 20 µA, spot measurements of 30-60s each), and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of pigments from miniatures of... -
ISA 2020/2022 presentation: XRF Ink analysis of selected fragments from the H...
XRF Ink analysis of selected fragments from the Herculaneum collection Hundreds of papyrus rolls, carbonized during the 79CE eruption of Mount Vesuvius, were discovered in 1754... -
Deutscher Orientalistentag 2022 presentation: Same but different – XRF study ...
Same but different – XRF study of inks from 13-14th centuries Torah scroll Ms Erfurt 7 (Berlin, Staatsbibliothek Preussicher Kulturbesitz, Ms. Or. fol. 1216) is a... -
X-Ray Fluorescence and Reflectography Data from Milan, Ambrosian Library, Ms ...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from Milan, Ambrosian... -
X-Ray Fluorescence and Reflectography Data from Berlin, Staatsbibliothek zu B...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, vis, NIR and UV light) analysis... -
X-Ray Fluorescence and Reflectography Data from Forschungsbibliothek Gotha Ms...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, vis, NIR and UV light) analysis... -
X-Ray Fluorescence and Reflectography Data from Dublin, Chester Beatty Librar...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks and pigments (for...