Gamma-ray background is often the main background source inneutron beamlines at new generation spallation facilities. Thegamma-ray components are produced within the target/reflector/moderator assemblies, in the beamline components,such as guides/shielding, in the sample area and in thesurrounding enclosure. Characterization of the gamma backgroundon a neutron spectrometer is of paramount importanceto determine its best operational conditions. This is particularlyrelevant for beamlines employing gamma-sensitive detectors.With this experiment we will attempt for the first time to measure the gamma-ray background of ChipIR by using a HPGe spectrometer.