Damage pathways in organic polymer transistors

DOI

The aim of the experiment is to test the damage pathways in organic semiconductor under high energy neutron irradiation. In the first experiment we propose to monitor the changes in charge carriers mobility of two conjugated polymers namely poly(3-hexylthiophene) [P3HT] and Poly(2,5-bis(3-hexadecylthiophen-2-yl)thieno[3,2-b]thiophene) [PBTTT] before and after neutron irradiation for as cast and annealed samples (100°C for 10 minutes). In addition we aim to study the possible changes of their optical properties under irradiation.

Identifier
DOI https://doi.org/10.5286/ISIS.E.24091354
Metadata Access https://icatisis.esc.rl.ac.uk/oaipmh/request?verb=GetRecord&metadataPrefix=oai_datacite&identifier=oai:icatisis.esc.rl.ac.uk:inv/24091354
Provenance
Creator Mr Giuseppe Paterno; Dr Victoria Garcia Sakai
Publisher ISIS Neutron and Muon Source
Publication Year 2016
Rights CC-BY Attribution 4.0 International; https://creativecommons.org/licenses/by/4.0/
OpenAccess true
Contact isisdata(at)stfc.ac.uk
Representation
Resource Type Dataset
Discipline Photon- and Neutron Geosciences
Temporal Coverage Begin 2013-07-28T23:00:00Z
Temporal Coverage End 2013-07-29T23:00:00Z