ToF-SIMS Parallel Imaging MS/MS of Lead Soaps in Embedded Paint Cross Sections

Dataset

DOI

ToF-SIMS imaging datasets of multilayered paint cross sections, embedded in polypol resin. It contains a positive and negative polarity ToF-SIMS image of Sample 1, a positive polarity MS/MS image of Sample 2, and a positive polarity MS/MS image of Sample 3. TOF-SIMS analyses were performed on a PHI nanoTOF II instrument (Physical Electronics, Chanhassen, MN, USA) equipped with a 30keV Binq+ liquid metal ion gun (LMIG) used as an analysis beam, and an Ar gas cluster ion beam (GCIB; 10keV) for nondestructive sputter cleaning.

The RAW files can be accessed using the commercial PHI software (TOF-DR 3.3.0.19).

Identifier
DOI	https://doi.org/10.34894/LRIH3A
Metadata Access	https://dataverse.nl/oai?verb=GetRecord&metadataPrefix=oai_datacite&identifier=doi:10.34894/LRIH3A

Provenance
Creator	Van Nuffel, Sebastiaan ; Garcia, Kimberly G
Publisher	DataverseNL
Contributor	Van Nuffel, Sebastiaan
Publication Year	2024
Rights	CC-BY-NC-SA-4.0; info:eu-repo/semantics/openAccess; http://creativecommons.org/licenses/by-nc-sa/4.0
OpenAccess	true
Contact	Van Nuffel, Sebastiaan (maastrichtuniversity.nl)

Representation
Resource Type	Dataset
Format	image/RAW
Size	654947250; 390539789; 55792016; 88688649
Version	1.0
Discipline	Chemistry; Natural Sciences
Spatial Coverage	Maastricht University, Maastricht, The Netherlands