This test will be part of commissioning program for ChipIR facility. We plan to use multiple boards with custom designed test ICs to evaluate single-event performance of FF and logic circuits. These ICs have been tested at Los Alamos National Labs in USA using their ICEHouse I facility. The results from tests at ISIS will allow a meaningful comparison between the two facilities. Our objective will be to obtain FIT rates for hardened and non-hardened FF designs.