ChipIr commercial access: IROC Technologies

DOI

Integrated Circuits will be tested at ChipIr beam line to reproduce errors induced by terrestrial radiation effects from fast neutrons.Radiation effects tests are part of the overall reliability of electronic components used in several market such as automotive, medical or networking.Objective will also be to continue comparing results with other test facilities such at LANSCE/WNR and TRIUMF/TNF.

Identifier
DOI https://doi.org/10.5286/ISIS.E.101133699
Metadata Access https://icatisis.esc.rl.ac.uk/oaipmh/request?verb=GetRecord&metadataPrefix=oai_datacite&identifier=oai:icatisis.esc.rl.ac.uk:inv/101133699
Provenance
Creator Dr Carlo Cazzaniga; Mr Cyrille BELTRANDO; Mr Erwin SCHAEFER; Mr A Duong IN
Publisher ISIS Neutron and Muon Source
Publication Year 2022
Rights CC-BY Attribution 4.0 International; https://creativecommons.org/licenses/by/4.0/
OpenAccess true
Contact isisdata(at)stfc.ac.uk
Representation
Resource Type Dataset
Discipline Construction Engineering and Architecture; Engineering; Engineering Sciences; Natural Sciences; Physics
Temporal Coverage Begin 2019-03-19T08:00:00Z
Temporal Coverage End 2019-03-22T08:00:00Z