High-speed X-ray study of process dynamics caused by surface features during continuous-wave laser polishing

This dataset contains raw files and experimental details for the manuscript "High-speed X-ray studyof process dynamics caused by surface features during continuous-wave laser polishing". This studyemploys high speed X-ray imaging to capture the process dynamics during continuous wave laser polishing in-situ, using a high-intensity X-ray beam to image a 2mm x 0.5mm area at 50,000 frames per second. A 200um laser beam with a gaussian profile and wavelength of 1070 nm was incident to a surface with a single ~100um triangular surface feature milled onto the surface. Laser power was 200 W and the scanning velocity was 200mm/s. The density changes captured by the high-intensity X-ray beam show the melt pool and corresponding keyhole to vary significantly in shape as the melt traverses the single surface feature. This shared data contains the following files and folders:1) X-ray stills (Raw): 631 frames/files; 12-bit grayscale images; Can be directly opened as an image stack in ImageJ software2) X-ray stills (filtered): 560 frames/files; 16-bit grayscale images;- Video was trimmed to make the Matlab code run faster by eliminating frames at the beginning and end where nothing was happening.- Corresponds to frames 21 through 580 in Raw X-ray stills- The top 50 rows and bottom 50 rows from Raw images were cropped out of these images 3) Supplementary video file (Raw):4) Supplementary video file (filtered):5) Image processing script 1: Matlab script for reading raw X-ray still images, filtering, and generating the composite image.6) Image processing script 2: Matlab script for determining keyhole boundary and measuring keyhole depth and width.7) Raw images of elctroetched melt pool cross sections8) Metadata: Laser beam characterizationThe data was collected on February 23rd - 25th at Argonne National Lab's Advanced Photon Source at beamline 32ID-B by Patrick Faue and Hemant Agiwal.Advanced Photon Source contacts: Samuel J. Clark and Kamel FezzaaThis research used resources of the Advanced Photon Source, a US Department of Energy (DOE) Office of Science user facility operated for the DOE Office of Science by Argonne National Laboratory under Contract No. DE-AC02-06CH11357. The study was funded through the National Science Foundation and German Research Foundation (NSF grant 1727366).Submitted manuscript: Patrick Faue, Lewin Rathman, Marius Möller, Mahmudul Hassan, Samuel J. Clark, Kamel Fezzaa, Kevin Klingbeil, Brodan Richter, Joerg Volpp, Tim Radel, Frank E. Pfefferkorn “High-speed X-ray study of process dynamics caused by surface features during continuous-wave laser polishing". CIRP ANNALS (2023)

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Identifier
DOI https://doi.org/10.17632/4jgpjjvbdc.1
PID https://nbn-resolving.org/urn:nbn:nl:ui:13-pm-bsso
Metadata Access https://easy.dans.knaw.nl/oai?verb=GetRecord&metadataPrefix=oai_datacite&identifier=oai:easy.dans.knaw.nl:easy-dataset:271498
Provenance
Creator pfefferkorn, F
Publisher Data Archiving and Networked Services (DANS)
Contributor Frank pfefferkorn
Publication Year 2023
Rights info:eu-repo/semantics/openAccess; License: http://creativecommons.org/licenses/by/4.0; http://creativecommons.org/licenses/by/4.0
OpenAccess true
Representation
Resource Type Dataset
Discipline Other