High-Entropy Design in Organic Semiconductors: A Systematic Study of Anthracene Blends

DOI

High-entropy materials combine five or more constituents into a single crystalline structure with unique emergent properties. While widely explored in inorganic systems, this concept is only beginning to be harnessed for organic semiconductors (OSCs). We recently demonstrated a proof-of-concept high-entropy OSC formed from a blend of 5 different diphenyl hexatriene derivatives, revealing unexpectedly high crystallinity. Building on this, our proposal targets anthracene-based OSCs to create five-component blends selected from 25 commercially available molecules. Using grazing incidence X-ray scattering (GIXS) at the XMaS beamline, we will systematically screen ~250 distinct formulations to discovering novel high-entropy crystal phases exhibiting enhanced structural order and enhanced electronic properties. By expanding the design space of OSCs and offering a pathway to low-embedded-energy devices, this study paves the way for an entirely new class of organic semiconductor materials.

Identifier
DOI https://doi.org/10.15151/ESRF-ES-2255549267
Metadata Access https://icatplus.esrf.fr/oaipmh/request?verb=GetRecord&metadataPrefix=oai_datacite&identifier=oai:icatplus.esrf.fr:inv/2255549267
Provenance
Creator Oier BIKONDOA ORCID logo; Michael HUTTON ORCID logo; Daniel TOOLAN (ORCID: 0000-0003-3228-854X); Christian MADDOX; RACHEL KILBRIDE (ORCID: 0000-0002-3985-923X)
Publisher ESRF (European Synchrotron Radiation Facility)
Publication Year 2028
Rights CC-BY-4.0; https://creativecommons.org/licenses/by/4.0
OpenAccess true
Representation
Resource Type Data from large facility measurement; Collection
Discipline Particles, Nuclei and Fields