Dataset - B2FIND

Auger recombination in low temperature silicon measured by photo-MuSR technique

We measure electron-hole recombination rate in low-temperature pure silicon using the photo-MuSR technique. The previous works have measured the recombination rate down to -30...
Auger recombination in low temperature silicon measured by photo-MuSR technique

We measure electron-hole recombination rate in low-temperature pure silicon using the photo-MuSR technique. The previous works have measured the recombination rate down to -30...

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2 datasets found