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1 dataset found
Keywords:
Würzburg charters
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X-Ray Fluorescence and Reflectography Data from Würzburg, Staatsarchiv Würzbu...
XRF (Elio: 40kV, 80 µA, spot measurements of 90s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from 45 Domkapitel...
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