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X-ray Fluorescence and reflectography data of Ethiopian manuscript CHJN003
XRF (Artax: 50kV, 600 µA, linescans of 10 points of 50s each each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, vis, NIR and UV... -
X-Ray Fluorescence and Reflectography Data from Dublin, Chester Beatty Librar...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, x200 magnification for spots on...
