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Multi-analytical Material Characterization – Background and Results
“Multi-analytical Material Characterization – Background and Results”, Manuscript Cultures in the Caucasus, Centre for the Study of Manuscript Cultures,... -
X-Ray Fluorescence and Reflectography Data from Dublin, Chester Beatty Librar...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, x200 magnification for spots on...
