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Collecting information and identification of Vilesida ord․ nov․
The dataset provides information on the material used for proposing Vilesida ord. nov. (Porifera: Demospongiae), to reassign Petromica and Axinyssa to the new order, to... -
Soft errors caused by muons and neutrons at 20 nm technology node
Soft errors are expected to be the most dominant failure mechanism at 20 nm technology node. With the low critical charge requirements for an upset (~ 0.1 fC), SRAM cells and...
