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Collecting information and identification of Vilesida ord. nov
This dataset supports the proposal of Vilesida ord. nov. (Porifera: Demospongiae), defined by molecular and chemotaxonomic evidence. Specimens from the Northeast Atlantic and... -
Soft errors caused by muons and neutrons at 20 nm technology node
Soft errors are expected to be the most dominant failure mechanism at 20 nm technology node. With the low critical charge requirements for an upset (~ 0.1 fC), SRAM cells and...
