Dataset - B2FIND

Data about surface passivation of c-Ge by Al2O3 films

Data regarding the measurement of effective surface recombination velocity (Seff) and fixed charge (Qf) as a function of aSiCx thickness. Data of Capacitance-Voltage (C-V)...
Data about surface passivation of c-Ge by Al2O3 films

Data regarding the measurement of effective surface recombination velocity (Seff) and fixed charge (Qf) as a function of aSiCx thickness. Data of Capacitance-Voltage (C-V)...

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2 datasets found