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Interaction of muonium centres and excess carriers in highly injected silicon
We have developed a method to measure carrier recombination lifetime in crystalline silicon with the photo-muSR technique. The key of the method is to measure the dependence of... -
Characterizing Mu in 6H-SiC with RF-MuSR
We propose a set of RF measurements on Silicon Carbide (polytype 6H) to identify and characterize the muonium species present below room temperature. One of the main goals of...
