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Neutron Study of the Dielectric Multilayer Systems SiNx and SiOxNy
Due to the strong influence of interface, layer thickness and film surface quality on the efficiency of multi-layer dielectric thin film based devices, a careful analysis of... -
diffuse scattering in PMN-PT crystals
Complex mixed-ion pervoskites, ferroelectric material (1-x)Pb(Mg1/3Nb2/3)O3-xPbTiO3, attract plenty of applications due to high piezoelectric response. The difficulties result...