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X-Ray Fluorescence, Reflectography and Fourier-transform Infrared Spectroscop...
XRF (ARTAX: 50kV, 600 µA, linescans of 10 points, diverse times used (12 to 30s), & spot analyses of 120s), Reflectography (DinoLite: x50 magnification, vis, NIR and... -
X-Ray Fluorescence and Reflectography Data from Würzburg, Staatsarchiv Würzbu...
XRF (Elio: 40kV, 80 µA, spot measurements of 90s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from 45 Domkapitel... -
X-Ray Fluorescence and Reflectography Data from Dublin, Chester Beatty Libra...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, vis, NIR and UV light) analysis... -
X-Ray Fluorescence and Reflectography Data from Oxford, Bodleian Library, MS ...
XRF (ARTAX: 50kV, 600 µA, linescans of 10 points of 20s each), and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from Ms Barocci 87... -
Imaging Techniques for the Classification of Ink Types in Medieval Manuscript...
Presentation at Virtual International Medieval Congress 2020 in Leeds (IMC2020) Session No.: v3-06 Session Name: Manuscripts, Texts, and Transmission, III Date: Monday 6... -
X-Ray Fluorescence and Reflectography Data from Paris, Bibliothèque Nationale...
XRF (Elio: 40kV, 20 µA, spot measurements of 60s each), and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from BNF Ms LAT10757(10th... -
X-Ray Fluorescence and Reflectography Data from Berlin, Staatsbibliothek zu B...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, vis, NIR and UV light) analysis... -
X-Ray Fluorescence and Reflectography Data from Dublin, Chester Beatty Librar...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, x200 magnification for spots on... -
X-Ray Fluorescence and Reflectography Data from Paris, Bibliothèque Nationale...
XRF (Elio: 40kV, 20 µA, spot measurements of 60s each), and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from BNF Parisinus Coislin... -
Date, Materiality and Historical Significance of P.Köln Inv. 5941
The paper presents the results of the radiocarbon dating and ink analysis of a leather fragment bearing an important liturgical text in Hebrew from the early centuries... -
X-Ray Fluorescence, Reflectography, Visible Spectrophotometry, Fourier-transf...
X-Ray Fluorescence (ARTAX: 50kV, 600 µA, linescans of 10-20 points, diverse times used (10 to 100s), & spot analyses of 120s), FTIR (Exoscans, diffuse reflection...