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Auger recombination in low temperature silicon measured by photo-MuSR technique
We measure electron-hole recombination rate in low-temperature pure silicon using the photo-MuSR technique. The previous works have measured the recombination rate down to -30... -
Auger recombination in low temperature silicon measured by photo-MuSR technique
We measure electron-hole recombination rate in low-temperature pure silicon using the photo-MuSR technique. The previous works have measured the recombination rate down to -30... -
Muonium in widegap oxides
This proposal is part of a long-range program aiming at determining the stable charge-state configurations, site and impurity energy levels (donor and/or acceptor) of hydrogen...