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(Table T1) Diatom biostratigraphy of ODP Hole 183-1140A
Sediment depth is given in mbsf. Abundance as follows: A = abundant, C = common, F = few, R = rare. Lowercase letters = reworking caused by drilling disturbance. -
(Table 14) Miocene diatom biostratigraphy of ODP Hole 120-751A
R = rare ( one specimen of a particular species encountered in 5-20 fields of view using a 40X objective and 10X ocular), F = frequent (one specimen in every 5 fields), C =... -
(Table 11) Occurrence of selected diatom species in ODP Hole 119-739C
Species abundance: A = abundant (>2 specimens in one field of view (X1800)), C = common (1 specimen in 2 fields), F = few (1 specimen in each horizontal transect), R = rare... -
(Table 6) Occurrence of selected diatom species in ODP Hole 119-737B
Species abundance: A = abundant (>2 specimens in one field of view (X1800)), C = common (1 specimen in 2 fields), F = few (1 specimen in each horizontal transect), R = rare... -
Range table from diatoms in ODP Hole 188-1165C
This dataset has no description
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(Table 2) Stratigraphic distribution and relative abundances of selected diat...
Species abundance: R = rare; S = sparse; F = frequent; C = common; A = abundant; lower-case abundance designators are interpreted as reworked occurrences. -
(Table 9) Miocene diatom biostratigraphy of ODP Hole 120-748B
R = rare ( one specimen of a particular species encountered in 5-20 fields of view using a 40X objective and 10X ocular), F = frequent (one specimen in every 5 fields), C =... -
(Table 6) Miocene diatom biostratigraphy of ODP Hole 120-747A
R = rare ( one specimen of a particular species encountered in 5-20 fields of view using a 40X objective and 10X ocular), F = frequent (one specimen in every 5 fields), C =... -
Relative abundance of selected diatom species from the Miocene at ODP Hole 11...
This dataset has no description
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Stratigraphic occurrence of selected diatom species from the Miocene at ODP S...
D (dominant) = >60 % of assemblage; A (abundant) = 30-60 % of assembl.; C (common) = 15-30% of assembl.; F (few) = 3-15 % of assembl.; R(rare) = 0.5-3% of assembl.; T(trace)...
