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NanoSIMS mapping of Bad Brueckenau topsoil samples, measurement 1
Analysed at Technical University of Munich, Germany. Raw count number given as ions at mass spectrometer. -
NanoSIMS mapping of Luess topsoil samples, measurement 1
Analysed at Technical University of Munich, Germany. Raw count number given as ions at mass spectrometer. -
NanoSIMS mapping of Bad Brueckenau topsoil samples, measurement 2
Analysed at Technical University of Munich, Germany. Raw count number given as ions at mass spectrometer. -
NanoSIMS mapping of Luess subsoil samples
Analysed at Technical University of Munich, Germany. Raw count number given as ions at mass spectrometer. -
NanoSIMS mapping of Bad Brueckenau subsoil samples, measurement 2
Analysed at Technical University of Munich, Germany. Raw count number given as ions at mass spectrometer. -
NanoSIMS mapping of Bad Brueckenau subsoil samples, measurement 1
Analysed at Technical University of Munich, Germany. Raw count number given as ions at mass spectrometer. -
NanoSIMS mapping of Luess topsoil samples, measurement 2
Analysed at Technical University of Munich, Germany. Raw count number given as ions at mass spectrometer. -
XRF mapping of Bad Brueckenau subsoil samples, Elettra-Sincrotrone
XRF mapping at Elettra-Sincrotrone Trieste S.C.p.A., Italy. Fluorescence intensity after spectra fitting and dead time correction, given as counts of element intensity at... -
XRF mapping of Luess subsoil samples, Elettra-Sincrotrone
XRF mapping at Elettra-Sincrotrone Trieste S.C.p.A., Italy. Fluorescence intensity after spectra fitting and dead time correction, given as counts of element intensity at... -
XRF mapping of Bad Brueckenau topsoil samples, Elettra-Sincrotrone
XRF mapping at Elettra-Sincrotrone Trieste S.C.p.A., Italy. Fluorescence intensity after spectra fitting and dead time correction, given as counts of element intensity at... -
XRF mapping of Bad Brueckenau topsoil samples, ESRF
XRF mapping at Elettra-Sincrotrone Trieste S.C.p.A., Italy. Fluorescence intensity after spectra fitting and dead time correction, given as counts of element intensity at... -
XRF mapping of Luess topsoil samples, ESRF
XRF mapping at Elettra-Sincrotrone Trieste S.C.p.A., Italy. Fluorescence intensity after spectra fitting and dead time correction, given as counts of element intensity at... -
XRF mapping of Bad Brueckenau subsoil samples, ESRF
XRF mapping at Elettra-Sincrotrone Trieste S.C.p.A., Italy. Fluorescence intensity after spectra fitting and dead time correction, given as counts of element intensity at... -
XRF mapping of Luess topsoil samples, Elettra-Sincrotrone
XRF mapping at Elettra-Sincrotrone Trieste S.C.p.A., Italy. Fluorescence intensity after spectra fitting and dead time correction, given as counts of element intensity at... -
XRF mapping of Luess subsoil samples, ESRF
XRF mapping at Elettra-Sincrotrone Trieste S.C.p.A., Italy. Fluorescence intensity after spectra fitting and dead time correction, given as counts of element intensity at...
