Photoinduced carrier lifetime in silicon: E-field application for carrier separation

DOI

This continuing experiment is proposed based on our previous experiment RB1510208, which we have carried out just recently. The experiment successfully observed the lifetime of the photoinduced carriers in intrinsitc silicon by utilising a combination of pulsed laser and muons. We could observe its temperature dependence from 291 to 20 K, but it is still necessary to have more data points in the low temperature range because this is where scientifically most important. We have also measured the ALC spectra changing dynamically as a function of laser-muon delay time. This observation brought us an idea of separating the charge carriers by an electric field, and observe the interaction of Mu and electrons/holes independently. This would also show us the dynamic feature of these carriers.

Identifier
DOI https://doi.org/10.5286/ISIS.E.71167469
Metadata Access https://icatisis.esc.rl.ac.uk/oaipmh/request?verb=GetRecord&metadataPrefix=oai_datacite&identifier=oai:icatisis.esc.rl.ac.uk:inv/71167469
Provenance
Creator Mr Prashantha Murahari; Professor Alan Drew; Dr Koji Yokoyama; Dr Leander Schulz; Dr Ke Wang; Dr James Lord; Miss Jingliang Miao; Mr Zhengqiang Yang
Publisher ISIS Neutron and Muon Source
Publication Year 2019
Rights CC-BY Attribution 4.0 International; https://creativecommons.org/licenses/by/4.0/
OpenAccess true
Contact isisdata(at)stfc.ac.uk
Representation
Resource Type Dataset
Discipline Natural Sciences; Physics
Temporal Coverage Begin 2016-05-05T08:00:00Z
Temporal Coverage End 2016-05-07T08:00:00Z