XRF mapping of Luess subsoil samples, Elettra-Sincrotrone

DOI

XRF mapping at Elettra-Sincrotrone Trieste S.C.p.A., Italy. Fluorescence intensity after spectra fitting and dead time correction, given as counts of element intensity at specific element edge.

Identifier
DOI https://doi.org/10.1594/PANGAEA.874479
Related Identifier https://doi.org/10.1594/PANGAEA.874444
Related Identifier https://doi.org/10.1038/s41598-017-03537-8
Metadata Access https://ws.pangaea.de/oai/provider?verb=GetRecord&metadataPrefix=datacite4&identifier=oai:pangaea.de:doi:10.1594/PANGAEA.874479
Provenance
Creator Werner, Florian ORCID logo; Mueller, Carsten W ORCID logo; Thieme, Jürgen; Gianoncelli, Alessandra; Rivard, Camille ORCID logo; Höschen, Carmen; Prietzel, Jörg
Publisher PANGAEA
Publication Year 2017
Rights Creative Commons Attribution 3.0 Unported; https://creativecommons.org/licenses/by/3.0/
OpenAccess true
Representation
Resource Type Dataset
Format text/tab-separated-values
Size 19200 data points
Discipline Earth System Research
Spatial Coverage (10.269 LON, 52.841 LAT)