Dataset for "Artifacts from manganese reduction in rock samples prepared by focused ion beam (FIB) slicing for X-ray microspectroscopy"

DOI

X-ray microspectroscopy data, corresponding to the research paper, published as: D. S. Macholdt et al.: Artifacts from manganese reduction in rock samples prepared by focused ion beam (FIB) slicing for X-ray microspectroscopy, Geosci. Instrumentation, Methods Data Syst., 8(1), 97–111, doi:10.5194/gi-8-97-2019, 2019. For specific data requests beyond the data deposited here, please contact the corresponding authors.

Identifier
DOI https://doi.org/10.17617/3.22
Metadata Access https://edmond.mpdl.mpg.de/api/datasets/export?exporter=dataverse_json&persistentId=doi:10.17617/3.22
Provenance
Creator Förster, Jan-David; Pöhlker, Christopher
Publisher Edmond
Publication Year 2019
OpenAccess true
Contact jd.foerster(at)mpic.de
Representation
Language English
Resource Type Dataset
Version 1
Discipline Other