Master 2 Practical : Investigation of Si bonding interfaces with X-ray reflectivity

DOI

The purpose of the experiment is to perform a practical with M2 students of the UGA. The topic of the practical will be the investigation of bonding interfaces in Si wafer using X-ray reflectivity.

Identifier
DOI https://doi.org/10.15151/ESRF-ES-1005233327
Metadata Access https://icatplus.esrf.fr/oaipmh/request?verb=GetRecord&metadataPrefix=oai_datacite&identifier=oai:icatplus.esrf.fr:inv/1005233327
Provenance
Creator Léo-Malik BENNEKA; Evan LEMUR; Samuel TARDIF ORCID logo; Zijie LU ORCID logo; Jean-Sebastien MICHA; Romeo VEYRY
Publisher ESRF (European Synchrotron Radiation Facility)
Publication Year 2025
Rights CC-BY-4.0; https://creativecommons.org/licenses/by/4.0
OpenAccess true
Representation
Resource Type Data from large facility measurement; Collection
Discipline Particles, Nuclei and Fields