RESPONSE LAW OF LOOK-AHEAD ELECTROMAGNETIC RESISTIVITY LWD

Dataset

DOI PID

The effect law of environmental factors on logging response is attached, including different tool parameters, formation resistivity, layer thickness and anisotropy etc.

Identifier
DOI	https://doi.org/10.17632/nxywr4zb2h.1
PID	https://nbn-resolving.org/urn:nbn:nl:ui:13-lv-cerg
Metadata Access	https://easy.dans.knaw.nl/oai?verb=GetRecord&metadataPrefix=oai_datacite&identifier=oai:easy.dans.knaw.nl:easy-dataset:121721

Provenance
Creator	Li, K
Publisher	Data Archiving and Networked Services (DANS)
Contributor	Kesai Li
Publication Year	2019
Rights	info:eu-repo/semantics/openAccess; License: http://creativecommons.org/licenses/by/4.0; http://creativecommons.org/licenses/by/4.0
OpenAccess	true

Representation
Resource Type	Dataset
Discipline	Other