Resonant diffraction on Fe doped CuO nanostructures

DOI

Magnetic semiconducting thin films with high coercive field and remanence at room temperature are of primary importance for spintronic applications. We will use x-ray resonant diffraction to study the substitutional Fe doping of monoclinic CuO islands in epitaxy on SrTiO3(001). RXD, measured at the Fe K edge, allows to quantify the occupancy rate of the two cations on a same crystallographic site. At the same time GIXRD will allow to exclude the presence of spurious phases.

Identifier
DOI https://doi.org/10.15151/ESRF-ES-1005233991
Metadata Access https://icatplus.esrf.fr/oaipmh/request?verb=GetRecord&metadataPrefix=oai_datacite&identifier=oai:icatplus.esrf.fr:inv/1005233991
Provenance
Creator Aude BAILLY; Maurizio DE SANTIS ORCID logo; Lucio MARTINELLI ORCID logo
Publisher ESRF (European Synchrotron Radiation Facility)
Publication Year 2025
Rights CC-BY-4.0; https://creativecommons.org/licenses/by/4.0
OpenAccess true
Representation
Resource Type Data from large facility measurement; Collection
Discipline Particles, Nuclei and Fields