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Gebruik van nieuwe communicatiemiddelen, 1999
Opinions about and use of information- and communication technology. Watching tv and use of other media / use of a bank guarantee card, mobile telephone, fax, telephone... -
ICT in het dagelijks leven van bewoners in Kenniswijk, 2003 : Nulmeting
This is a preliminary description: Survey of Kenniswijk ( designated regions in the Dutch cities of Eindhoven and Helmond), aimed at describing the use of information- and... -
Culturele Veranderingen in Nederland 1989 - CV'89
Conditions for shorter working hours: income versus leisure / working conditions, quality of job / doing volunteer work / satisfaction with social position / leisure activities,... -
Technologie en samenleving 1975 : De toepassing van kernenergie
Attitude towards the use of nuclear energy / communication patterns / information / attitude to economic growth, to technological developments, social developments, scientific... -
Korpus - Wikinews
Corpus with texts on various topics from the world and technology. -
Study of Co- and Fe-doped and undoped hafnium oxide tunnel barrier structures
We propose to investigate with polarized neutron reflection (PNR) measurements the magnetic moment and interface properties of Co- and Fe-doped HfO2 thin films and undoped HfO2... -
Neutron diffraction study of the casting technology of antique bronze coins
Neutron tomography data on high-Pb antique bronze coins indicated that two different copper alloy phases are formed during the casting process. We propose to use GEM for... -
Phase-object approximation in neutron reflectometry
Recently De Haan et al. described the phase-object approximation for small angle neutron scattering. This method can be extended towards neutron reflectometry. Prelimenary... -
Self-assembly in biosurfactants and biosurfactant / surfactant mixtures
This proposal is part of a new project which is a collaboration between Oxford, Newcastle, Ulster, and Unilever on the development of sustainable laundry detergents, using... -
Soft errors caused by muons and neutrons at 20 nm technology node
Soft errors are expected to be the most dominant failure mechanism at 20 nm technology node. With the low critical charge requirements for an upset (~ 0.1 fC), SRAM cells and...