-
(Table 3) Occurrences of diatoms species in DSDP Hole 41-369A
Sediment depth is given in mbsf. Numbers indicate individuals encountered during 100 counts of resting spore valves; <1 indicates epivalves encountered after the count. -
(Table 2) Occurrences of diatoms species in DSDP Hole 41-366
Sediment depth is given in mbsf. Numbers indicate individuals encountered during 100 counts of resting spore valves; <1 indicates epivalves encountered after the count. -
(Table 12) Diatom biostratigraphy of ODP Hole 167-1021B sediments
DEPTH, sediment is given in mbsf. Abundance estimates as follows: A = abundant, C = common, F = few, R = rare, T = trace, and B = barren, - = not found. -
(Table 7) Diatom biostratigraphy of ODP Hole 167-1016A sediments
DEPTH, sediment is given in mbsf. Abundance estimates as follows: A = abundant, C = common, F = few, R = rare, T = trace, and B = barren, - = not found. -
(Table 6) Diatom biostratigraphy of ODP Hole 167-1014A sediments
DEPTH, sediment is given in mbsf. Abundance estimates as follows: A = abundant, C = common, F = few, R = rare, T = trace, and - = not found. -
(Table 4) Diatom biostratigraphy of ODP Hole 167-1010C sediments
DEPTH, sediment is given in mbsf. Abundance estimates as follows: A = abundant, C = common, F = few, R = rare, T = trace, and B = barren, - = not found. -
(Table T1) Biostratigraphy of selected Oligocene and lowermost Miocene diatom...
DEPTH, sediment is given in mbsf. Abundance estimate as follows: A = abundant, C = common, F = few, R = rare, VR = very rare, B = barren, - = not found, r = reworked, cf =... -
(Table T3) Diatom biostratigraphy of ODP Site 170-1040 sediments
Sediment depth is given in mbsf. Abundance estimates as follows: A = abundant, C = common, F = frequent, R = rare, B = barren, r = reworked, - = not found. -
(Table T2) Diatom biostratigraphy of ODP Site 170-1039 sediments
Sediment depth is given in mbsf. Abundance estimates as follows: A = abundant, C = common, F = frequent, R = rare, B = barren, r = reworked, - = not found. -
(Table T1) Neogene stratigraphy of diatoms, ebridians and endoskeletal dinofl...
Sediment depth is given in mbsf. Abundance estimate as follows: A = abundant, C = common, F = few, R = rare, X = present, B = barren, r = rare occurrences of a taxon interpreted... -
(Table T1) Diatom biostratigraphy of ODP Hole 183-1140A
Sediment depth is given in mbsf. Abundance as follows: A = abundant, C = common, F = few, R = rare. Lowercase letters = reworking caused by drilling disturbance. -
(Table T1) Diatom biostratigraphy of ODP Site 204-1251
Sediment depth is given in mbsf. <1 = species found as a fragment or after a routine count. -
(Table 3) Diatom abundances in ODP Hole 150-906A
Species abundance: A = abundnat, C = common, R = rare, -= absent. -
(Table 2) Diatom abundances in ODP Hole 150-903A
Species abundance: A = abundnat, C = common, R = rare, -= absent. -
(Table 1) Diatom abundances in ODP Hole 150-902D
Species abundance: A = abundnat, C = common, R = rare, -= absent. -
(Table 2) Relative abundance and occurence for selected siliceous microfossil...
r = Reworked: rare occurence of a taxon noted and interpreted as reworked; fr = Fragment: rare fragment(s) of the taxon present; X = Present: complete specimens rare (=< 1... -
Occurence data for diatoms, silicoflagellates, ebridians and stratigraphicall...
This dataset has no description
-
Stratigraphic occurrence of selected diatom species from the Miocene at ODP S...
D (dominant) = >60 % of assemblage; A (abundant) = 30-60 % of assembl.; C (common) = 15-30% of assembl.; F (few) = 3-15 % of assembl.; R(rare) = 0.5-3% of assembl.; T(trace)... -
Stratigraphic occurrence of selected diatom species from the Miocene at ODP H...
D (dominant) = >60 % of assemblage; A (abundant) = 30-60 % of assembl.; C (common) = 15-30% of assembl.; F (few) = 3-15 % of assembl.; R(rare) = 0.5-3% of assembl.; T(trace)... -
Stratigraphic occurrence of selected diatom species from the Miocene at ODP H...
D (dominant) = >60 % of assemblage; A (abundant) = 30-60 % of assembl.; C (common) = 15-30% of assembl.; F (few) = 3-15 % of assembl.; R(rare) = 0.5-3% of assembl.; T(trace)...
