Visualization of stacking faults in InSb micropillars by ptychographic topography

DOI

X-ray Ptychographic topography, a new tool for strain imaging

Identifier
DOI https://doi.org/10.16907/60d33e31-d44e-457f-90e9-c3c5618afc8a
Metadata Access https://doi.psi.ch/oaipmh/oai?verb=GetRecord&metadataPrefix=oai_dc&identifier=10.16907/60d33e31-d44e-457f-90e9-c3c5618afc8a
Provenance
Creator Mariana Verezhak
Publisher PSI
Publication Year 2020
Rights Available to the public.
OpenAccess true
Contact PSI
Representation
Resource Type Dataset
Discipline ['Life Sciences', 'Biology', 'Basic Biological and Medical Research']