XRF (ARTAX: 50kV, 600 µA, linescans of 10 points of 20s each), and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of ink on  Hodgson Ms35  from the Royal Asiatic Society, London (UK) as part of SFB950 project C01.

Analysis of 9 folios: 31 spots on ink, 9 on palm leaf support:

Reflectography_HodgsonMS35.zip - full reflectography dataset
XRF_HodgsonMS35.zip - full XRF dataset
XRFprocessing_HodgsonMS35.xlsx - detailed XRF results and processing
Results_Hodgson MS35.pptx - detailed reflectography and XRF results

MSI was also performed to recover damaged writing. Link to dataset is included in related identifier.

The research for project C01 was funded by the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) within the Sonderforschungsbereich 950 (SFB 950). The research was conducted within the scope of the Centre for the Study of Manuscript Cultures (CSMC) at Universität Hamburg in collaboration with the Bundesanstalt für Materialforschung und -prüfung (BAM).

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