EPMA data from tephra layer in IODP 374 Expedition Site U1524


Major-element data of single glass shards (raw data, normalized, and from U1524 tephra found in the U1524 from IODP Expedition 374 sites. Analyses were carried out with a JEOL JXA 8230 electron probe microanalyzer (EPMA) at Victoria University of Wellington using wavelength dispersive spectrometry techniques. Data includes calibrated international standards including ATHO-G, T1-G (Jochum et al., 2006), and VG-568 (USNM 72854) analyzed to monitor instrumental drift as well as the precision and accuracy of the analyses.

DOI https://doi.org/10.1594/PANGAEA.933364
Related Identifier https://doi.org/10.1029/2021GC009739
Metadata Access https://ws.pangaea.de/oai/provider?verb=GetRecord&metadataPrefix=datacite4&identifier=oai:pangaea.de:doi:10.1594/PANGAEA.933364
Creator Di Roberto, Alessio; Scateni, Bianca; Di Vincenzo, Gianfranco; Petrelli, Maurizio; Fisauli, G; Barker, S J; Del Carlo, Paola; Colleoni, Florence; Kulhanek, Denise K; McKay, Robert M; de Santis, Laura; The IODP Expedition 374 Scientific Party
Publisher PANGAEA - Data Publisher for Earth & Environmental Science
Publication Year 2021
Rights Creative Commons Attribution 4.0 International; https://creativecommons.org/licenses/by/4.0/
OpenAccess true
Language English
Resource Type Collection of Datasets; Collection
Format application/zip
Size 2 datasets
Discipline Earth System Research
Spatial Coverage (-173.634 LON, -74.217 LAT)